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Reinvent Modeling: Characterizing and capturing Si realities for sub-20nm CMOS
- Models and Analyses for 3D IC Integrity (Li—Texas A&M University)
Restructure Analog/RF: Verification and self-healing of analog and RF modules
- RF N/MEMS Resonators and Oscillators for Self-Healing Circuits (Weinstein—MIT; Mukherjee, Fedder—Carnegie Mellon University)
- Investigation of Formal Verification Methods for Self-Healing Analog/RF Systems (Krogh, Li—Carnegie Mellon University)
Verify and Repair: Redefining test for monitoring, diagnosis and repair of digital modules/systems
- On-Chip Diagnostics (Blanton—Carnegie Mellon University)
- Self-Healing Memory Systems for Maximum-Information Data Storage (Li—Carnegie Mellon University)
- Virtual Probe: Efficient Statistics for Low-Cost Silicon Testing and Tuning (Rutenbar—University of Illinois; Li—Carnegie Mellon University)
- Digitally Intensive In Situ Test and Adaptation (Li—Texas A&M University)
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